Saturday, September 14

7:00 AM
7:30 AM

Continental Breakfast (Tutorial Attendees Only)

8:00 AM

ESD Compliance Verification Technician to TR53™ - Day 1

8:30 AM

FC100: ESD Basics for the Program Manager

FC340: ESD Program Development and Assessment (ANSI/ESD S20.20 Seminar) - Day 1

Introduction to On-Chip ESD Protection

10:00 AM

Morning Break (Tutorial Attendees Only)

12:00 PM

Lunch (Tutorial Attendees Only)

2:30 PM

Afternoon Break (Tutorial Attendees Only)

Sunday, September 15

7:00 AM
7:30 AM

Continental Breakfast (Tutorial Attendees Only)

8:00 AM

ESD Compliance Verification Technician to TR53™ - Day 2

8:30 AM

FC340: ESD Program Development and Assessment (ANSI/ESD S20.20 Seminar) - Day 2

FC101: How To’s of ESD Auditing and Evaluation Measurements

Introduction to Characterization of On-Chip ESD Protection

10:00 AM

Morning Break (Tutorial Attendees Only)

12:00 PM

Lunch (Tutorial Attendees Only)

1:00 PM

Overview on ESD and Latch-up Challenges in 2.5D and 3D-Stacked ICs

2:30 PM

Afternoon Break (Tutorial Attendees Only)

3:00 PM

ESD Design Challenges of RF and High Speed I/Os

5:00 PM

EOS/ESD Association, Inc. Annual Meeting & Reception - Open to All Attendees

Monday, September 16

7:00 AM

Continental Breakfast

8:00 AM

ESD Compliance Verification Technician to TR53™ - Exam

8:30 AM

Keynote - Memory Technology Advancements Driving High Performance, Reliable Systems

9:20 AM
9:30 AM

EDA Invited Talk - Applications of Machine Learning to Microelectronics Design

Device Testing Invited Talk - CDM Bare Die Testing, ESDA CDM Joint Working Group Technical Report Overview

10:20 AM

Networking Coffee Break

10:50 AM

1B.1 TLP/VFTLP Investigation on eNVM 1T1R PCM in FD-SOI UTBB CMOS Technology at Room Temperature (ESREF Invited Paper)

EDA Invited Talk - ESD Reliability in Advanced Nodes

11:15 AM

1B.2 Can CC-TLP be Used as an Early Failure Analysis Tool?

11:40 AM

Authors Corner for 1B.1 and 1B.2

12:00 PM

Symposium Paper Awards Presentation Lunch

1:00 PM

Manufacturing Invited Talk - Air Ionization and it’s Use in Controlling Static Charge

EDA Interactive Presentation and Workshop - ESD Electronic Design Automation Challenges - New Revision of ESDA Technical Report ESD TR18.0-01

1:50 PM

Manufacturing Invited Talk - Healthcare Risks, General Overview, and Introduction

2:15 PM

Manufacturing Invited Talk - Electrostatic Discharge (ESD) Control in Healthcare

2:40 PM

Afternoon Networking Break

First Time Attendee and Emerging Professionals Reception

3:10 PM

1A.1 Accuracy Preserving Extensions to a PDK MOSFET Model for ESD Simulation

M1.1 In-Situ ESD Current Sensing in a Pick and Place Machine

3:35 PM

1A.2 CDM ESD Risk Assessment for Ground-Crossing Circuit Through PERC P2P/CD Programming

M1.2 Qualification Challenges of Conductive and Dissipative Plastics

4:00 PM

Author's Corner for 1A.1 and 1A.2

Authors Corner for M1.1 and M1.2

4:20 PM

Manufacturing Hands-On Intro Presentation - Ionization

1A.3 A Physics-Based Model for ESD Protection Devices with Open Base BJT Configuration

4:45 PM

Manufacturing Hands-On Session - Ionization

1A.4 Substrate NPN Extraction from Capacitance Field Solver

5:00 PM

Professional and Technical Women's Reception

5:10 PM

1A.5 An Efficient and Cost-effective Method to Detect and Analyze ESD CDM Risks in Designs

5:35 PM

Authors Corner for 1A.3, 1A.4, and 1A.5

6:00 PM

Welcome Reception and Exhibits Open

Tuesday, September 17

7:00 AM

Continental Breakfast

8:00 AM
8:10 AM

Keynote - Charting the Connected Future

8:30 AM

Exhibits Open - Coffee in the exhibit hall until 5:45 pm

9:00 AM

Activities in the Exhibit Hall - Guided Introduction Tours to Meet the Exhibitors

Networking Coffee Break in the exhibit hall

9:45 AM

2A.1 ESD Behavior of RF Switches and Importance of System Efficient ESD Design (EMC+SIPI Exchange Paper)

Manufacturing Hands-On Intro Presentation - Personnel Grounding

10:10 AM

2A.2 On-Chip ESD Protection for Multi-Gbps Automotive Serial IO in a 16-nm FinFET Process

Manufacturing Hands-on Session - Personnel Grounding

10:35 AM

2A.3 Influence of TVS Properties and Printed Circuit Board Design on System Level ESD Robustness for USB-C High-Speed Data Lines

11:00 AM

Authors Corner for 2A.1, 2A.2, and 2A.3

11:20 AM

Activities in the Exhibit Hall - 20-minute In-Booth Demonstrations (parallel sessions)

12:00 PM

EMC Invited Talk - Considerations for ESD Protection in USBC Interface

Manufacturing Invited Talk - Overview of all ESDA Control Standards

12:50 PM

Light Networking Lunch in the exhibit hall

1:50 PM

System Level Workshop - Automotive System Level ESD Protection Design in the Times of Multi-Gigabit Data Rates

Device Testing Workshop - Contact CDM: From Characterization Tool to Qualification Standard

3:05 PM

Afternoon Networking Break in the Exhibit Hall

3:35 PM

EMC Invited Talk (with Paper) - Extending ESD Network Capability to EOS and Overvoltage Protection

2B.1 Consideration of Waveform Analysis and Test Method for Charged Board Event (RCJ Exchange Paper)

Activities in the Exhibit Hall - Manufacturing Showcase Demonstrations - Seating, Bags, Process Assessment

4:00 PM

2B.2 Proposing a Strategy to Prevent Module-level Charged Device Model Failures in Dual In-line Memory Modules

4:25 PM

Standards Corner: Learn more about EOS/ESD Association, Inc. Standards

Authors Corner for 2B.1 and 2B.2

4:55 PM

3A.1 ESD Robustness of Germanium Photodetectors in Advanced Silicon Photonics Technology

2B.3 Intrinsic Inductance and Time-Dependent Resistance of the FI-CDM Spark

Activities in the Exhibit Hall - Manufacturing Showcase Demonstrations - Seating, Bags, Process Assessment

5:20 PM

3A.2 ESD-EOS-OVP Protection Network for Battery Pins

2B.4 The Demand for a CDM Bare Die Testing Method

5:45 PM