Committees
2026 Steering Committee
Strategy Chair - Gianluca Boselli, Texas Instruments
General Chair - James DiSarro, Texas Instruments
Vice General Chair - Alain Loiseau, GLOBALFOUNDRIES
Technical Program Committee Chair - Slavica Malobabic, Cirrus Logic
Workshop Chair - Marko Simicic, imec
2026 TPC
Advanced CMOS (Analog/Digital) EOS/ESD and Latchup, ESD Protection in Bipolar, RF, High Voltage and BCD Technologies
| Rebello | Alwyn | GlobalFoundries |
| Mahajan | Prantik | Renesas |
| Kazuki | Shimada | Renesas |
| Bourgeat | Johan | STMicroelectronics |
| Dissegna | Mariano | TI |
| Chen4 | Wen-Chieh | IMEC |
| Parthasarathy | Srivatsan | Analog |
| Orr | Benjamin | Intel |
Numerical Modeling and Simulation for On-Chip ESD Protection and Chip/Module/Package EOS/ESD Electronic Design Automation
| Shibkov | Andrei | Angstrom Design automation |
| Meng | Kuo-Hsuan | Silicon Labs |
| Vashchenko | Vladislav | Analog |
| Gallerano | Antonio | TI |
| Rosenbaum | Elyse | UIUC |
| Aharoni | Efraim | Tower Semiconductor |
| Hogan | Matthew | Siemens EDA |
EOS/ESD Failure Analysis, Troubleshooting and Case Studies
| Di Biccari | Leonardo | STMicroelectronics |
| Kontos | Dimitrios | Analog |
| Concannon | Ann | TI |
| Okushima | Mototsugu | Renesas |
| Chen | Chen | AMD |
| Scholz | Mirko | Infineon |
Device Testing: Testers, Methods and Correlation Issues
| Boroni | Andrea | STMicroelectronics |
| Muhonen | Kathy | Qorvo |
| O'Sullivan | Greg | Micron |
| Maloney | Tim | Center for Analytic Insights |
| Verwoerd | Sheela | NXP |
| Johnsson | David | HPPI |
| Ashton | Robert | - |
System Level EOS/ESD/EMC, HMM
| Kunz | Hans | TI |
| Willemen | Joost | Infineon |
| Shringarpure | Ketan | |
| Spray | Andrew | Synaptics |
| Marathe | Shubhankar | Amazon |
| Peng1 | Zhekun | Apple |
| Tamminen | Pasi | Danfoss |
EOS/ESD in Manufacturing
| Fung | Rita | Cisco |
| Yoo | Joshua | Core Insight |
| Nold | Andy | Teradyne |
| Skolnik | Jay | Skolnik Technical |
| Viheriäkoski | Toni | Cascade Metrology |
| Merkel | Ellen | Fraunhofer |