Committees
2025 Steering Committee
Strategy Chair - Ann Concannon, Texas Instruments
General Chair - Mirko Scholz, Infineon Technology AG
Vice General Chair - James DiSarro, Texas Instruments
Technical Program Committee - Alain Loiseau, GLOBALFOUNDRIES
Workshop Chair - Slavica Malobabic, Cirrus Logic
Presentation Manager - Marko Simicic, imec
Presentation Co-Manager - Wei Liang, Intel
2025 TPC
Advanced CMOS (Analog/Digital) EOS/ESD and Latchup, ESD Protection in Bipolar, RF, High Voltage and BCD Technologies
| Prantik | Mahajan | Renesas |
| Carol Rouying | Zhan | ON Semiconductor |
| Krishna | Rajagopal | TI |
| Dolphin | Abessolo Bidzo | NXP |
| Shih-Hung | Chen | imec |
| Alwyn | Rebello | GlobalFoundries |
| Charvaka | Duvvury | TI Fellow Emeritus |
Numerical Modeling and Simulation for On-Chip ESD Protection and Chip/Module/Package EOS/ESD Electronic Design Automation
| Kuo-Hsuan | Meng | Silicon Labs |
| Eleonora | Gevinti | STMicroelectronics |
| Steven Sze Hang | Poon | TSMC |
| Paul | Zhou | Analog |
| Kateryna | Serbulova | imec |
| Christian | Russ | Infineon |
| Nagothu | Kranthi | Texas Instruments |
EOS/ESD Failure Analysis, Troubleshooting and Case Studies
| Dimitrios | Kontos | Analog |
| Guido | Quax | NXP |
| Shudong | Huang3 | UIUC |
| Leonardo | Di Biccari | STMicroelectronics |
| Mototsugu | Okushima | Renesas |
| James | Davis | Micron |
| Mujahid | Muhammad | Intel |
Device Testing: Testers, Methods and Correlation Issues
| Kathy | Muhonen | Qorvo |
| Scott | Ward | TI |
| Marko | Simicic | imec |
| Brett | Carn | Intel - retired |
| Andrea | Boroni | STMicroelectronics |
| Tim | Maloney | Center for Analytic Insights |
| Robert | Ashton |
System Level EOS/ESD/EMC, HMM
| Joost | Willemen | Infineon |
| Pasi | Tamminen | Danfoss |
| Ketan | Shringarpure | |
| David | Pommerenke | TU Graz |
| Martin | Pilaski | Nexperia |
| Hans | Kunz | TI |
| Harald | Gossner | Intel |
EOS/ESD in Manufacturing
| Joshua | Yoo | Core Insight |
| Lena | Zeitlhöfler | Infineon |
| Toni | Viheriäkoski | Cascade Metrology |
| Michelle | Lam | IBM |
| Rita | Fung | Cisco |
| Gregory | Larson | Intel |
| Ellen | Merkel | Fraunhofer |