Agenda

Chen is a Fellow and Senior Director at NXP Semiconductors. With a Ph.D. in Computer Engineering from the University of Texas at Austin, he has more than 20 years of experience and leadership in automotive microcontrollers and processors development, especially in the area of Zero Defect (ZD) stress and test methodology. His interests also include embedded Non-Volatile Memory (NVM) and Machine Learning (ML) applications to test. Chen has been issued 32 US patents and published over 35 technical papers. He has been elected to IEEE Fellow for his contributions to the test of automotive microcontrollers and microprocessors since January 1, 2023.

Dr. Vladislav Vashchenko is Sr. Director Power ESD Group at Analog Devices Corp (started in 2011 at acquired Maxim Integrated), responsible for the main aspects of ESD-IC co-design business process and technology development. Prior to this term, he oversaw the ESD technology development group at National Semiconductor (2000-2011). He received his MS Engineer-Physicist (1987), Ph.D. in Physics of Semiconductors from MIPT (1990), and "Doctor of Science in Microelectronics” habilitation degree (1997). He is the author of 150 U.S. patents, over 120 papers, and co-author of the books "Physical Limitation of Semiconductor Devices” (2008), "ESD Design for Analog Circuits” (2010), and "System Level ESD Protection” (2014) by Springer.

Andrei Shibkov, Ph.D. has been working in the device design, reliability, process development, TCAD, and EDA area for over 25 years, starting with his graduate work (MS, Engineer-Physicist - 1993 and Ph.D. in Semiconductor Physics - 1996) at Moscow Institute of Physics and Technology (MIPT) then at Samsung Electronics, PDF Solutions, Sequoia Design Systems, Diakopto, and Angstrom Design Automation. During this time, he was involved in all aspects of the semiconductor process and device development and optimization, characterization, yield management, ESD and reliability, sub-wavelength lithography simulation, and EDA and TCAD tool development.

Andrei Shibkov, Ph.D. has been working in the device design, reliability, process development, TCAD, and EDA area for over 25 years, starting with his graduate work (MS, Engineer-Physicist - 1993 and Ph.D. in Semiconductor Physics - 1996) at Moscow Institute of Physics and Technology (MIPT) then at Samsung Electronics, PDF Solutions, Sequoia Design Systems, Diakopto, and Angstrom Design Automation. During this time, he was involved in all aspects of the semiconductor process and device development and optimization, characterization, yield management, ESD and reliability, sub-wavelength lithography simulation, and EDA and TCAD tool development.

Dr. Vladislav Vashchenko is Sr. Director Power ESD Group at Analog Devices Corp (started in 2011 at acquired Maxim Integrated), responsible for the main aspects of ESD-IC co-design business process and technology development. Prior to this term, he oversaw the ESD technology development group at National Semiconductor (2000-2011). He received his MS Engineer-Physicist (1987), Ph.D. in Physics of Semiconductors from MIPT (1990), and "Doctor of Science in Microelectronics” habilitation degree (1997). He is the author of 150 U.S. patents, over 120 papers, and co-author of the books "Physical Limitation of Semiconductor Devices” (2008), "ESD Design for Analog Circuits” (2010), and "System Level ESD Protection” (2014) by Springer.